Flicker noise induced by dynamic impurities in a quantum point contact.

We calculate low-frequency noise (LFN) in a quantum point contact (QPC) which is electrostatically defined in a 2D electron gas of a GaAs-AlGaAs heterostructure. The conventional source of LFN in such systems are scattering potentials fluctuating in time acting upon injected electrons. One can discriminate between potentials of different origin – noise may be caused by the externally applied gateand source-drain voltages, the motion of defects with internal degrees of freedom close to the channel, electrons hopping between localized states in the doped region, etc. In the present study we propose a model of LFN based upon the assumption that there are many dynamic defects in the surrounding of a QPC. A general expression for the ∗Electronic address: [email protected]